Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction

Standard Guide for Ranking Footwear Bottom Materials on Contaminated Walkway Surfaces According to Slip Resistance Test Results (Withdrawn 2018)

Standard Terminology of Silicon Technology (Withdrawn 2003)

Standard Specification for Cuffed and Uncuffed Tracheal Tubes (Withdrawn 2002)

Standard Specification for Tracheal Tube Connectors (Withdrawn 2002)

Standard Specification for Berths, Marine

Standard Specification for Faucets, Single and Double, Compression and Self-Closing Type, Shipboard

Standard Specification for Electrically Powered Home Care Ventilators, Part 1-Positive-Pressure Ventilators and Ventilator Circuits

Standard Specification for Intrusion Resistant Generic Vault Structures

Standard Test Method for Determination of Environmental Stress Crack Resistance (ESCR) of Polyethylene Pipe

Standard Specification for Stationary Upright and Recumbent Exercise Bicycles and Upper and Total Body Ergometers

Standard Terminology Relating to Polymeric Biomaterials in Medical and Surgical Devices

Standard Test Method for Measuring Optical Reflectivity of Transparent Materials

Guide for Training the Emergency Medical Technician (Basic) to Perform Patient Secondary Assessment (Withdrawn 1999)

Standard Practice for Performance of Prehospital Manual Defibrillation (Withdrawn 2007)

Standard Practice for Performance of Prehospital Automated Defibrillation

Standard Guide for Selection and Practice of Emergency Medical Services Instructor for Emergency Medical Technician (EMT) Training Programs

Standard Guide for Selection and Practice of Emergency Medical Services Instructor for Advanced Emergency Medical Technician

Standard Practice for Emergency Medical Dispatch

Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration

Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]

Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations

Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]

Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)