BSI BS 7317-6:1990

Current Revision
Methods for analysis of high purity copper cathode Cu-CATH-1 -- Method for determination of phosphorus and silicon by spectrophotometry

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BSI BS 7317-6:1990

Methods for analysis of high purity copper cathode Cu-CATH-1 -- Method for determination of phosphorus and silicon by spectrophotometry

PUBLISH DATE 1990
PAGES 8
BSI BS 7317-6:1990

This Part of BS 7317 describes a method for the determination of the actual amounts of the impurity elements phosphorus and silicon present in high purity copper cathode (designated Cu-CATH-1), by spectrophotometry.

It is applicable to concentrations of the elements not exceeding the following limits:

  • phosphorus: 20 ยตg/g (0.0020 % m/m) maximum;
  • silicon: 25 ยตg/g (0.0025 % m/m) maximum.

NOTE The titles of the publications referred to in this Part of BS 7317 are listed on the inside back cover.

Applies to low levels in high purity copper cathode specified in BS 6017.

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