Logo
Login Sign Up
Current Revision

BSI BS 9300:1969

Specification for semiconductor devices of assessed quality: generic data and methods of test
Best Price Guarantee
Instant

$479.76

2-5 Days

$479.76

SAVE 10%

$863.57


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
British Standards Institution Logo

BSI BS 9300:1969

Specification for semiconductor devices of assessed quality: generic data and methods of test

PUBLISH DATE 1969
PAGES 584
BSI BS 9300:1969

Generic Data and Methods Of

Forms part of the system of standards for electronic components of assessed quality. Terms, definitions, test methods and other material necessary to implement fully the detail specifications for semiconductor devices.

Included in section 2 are the general rules for preparation of detail specifications. Appendix C gives the agreed procedure for the adoption of specifications in the CV7000 series into the BS 9000 system.

See also PD 6460.

SDO BSI: British Standards Institution
Document Number 9300
Publication Date July 31, 1969
Language en - English
Page Count 428
Revision Level
Supercedes
Committee EPL/47
Loading...

Failed to load document history.

Publish Date Document Id Type View