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BSI BS EN 60512-25-6:2004

Connectors for electronic equipment. Tests and measurements -- Test 25f. Eye pattern and jitter
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BSI BS EN 60512-25-6:2004

Connectors for electronic equipment. Tests and measurements -- Test 25f. Eye pattern and jitter

PUBLISH DATE 2004
PAGES 20
BSI BS EN 60512-25-6:2004
Describes methods for measuring an eye pattern response and jitter in the time domain.
SDO BSI: British Standards Institution
Document Number EN 60512-25-6
Publication Date Aug. 9, 2004
Language en - English
Page Count 20
Revision Level
Supercedes
Committee EPL/48
Publish Date Document Id Type View
Aug. 9, 2004 BS EN 60512-25-6:2004 Revision