BSI BS EN 60512-25-6:2004

Current Revision
Connectors for electronic equipment. Tests and measurements -- Test 25f. Eye pattern and jitter

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BSI BS EN 60512-25-6:2004

Connectors for electronic equipment. Tests and measurements -- Test 25f. Eye pattern and jitter

PUBLISH DATE 2004
PAGES 20
BSI BS EN 60512-25-6:2004

Describes methods for measuring an eye pattern response and jitter in the time domain.

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