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BSI BS EN 60749-11:2002

Semiconductor devices. Mechanical and climatic test methods -- Rapid change of temperature. Two-fluid-bath method
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BSI BS EN 60749-11:2002

Semiconductor devices. Mechanical and climatic test methods -- Rapid change of temperature. Two-fluid-bath method

PUBLISH DATE 2003
PAGES 12
BSI BS EN 60749-11:2002
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.
SDO BSI: British Standards Institution
Document Number EN 60749-11
Publication Date Oct. 24, 2003
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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