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BSI BS EN 60749-12:2002

Semiconductor devices. Mechanical and climatic test methods -- Vibration, variable frequency
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BSI BS EN 60749-12:2002

Semiconductor devices. Mechanical and climatic test methods -- Vibration, variable frequency

PUBLISH DATE 2002
PAGES 8
BSI BS EN 60749-12:2002
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
SDO BSI: British Standards Institution
Document Number EN 60749-12
Publication Date Sept. 10, 2002
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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