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BSI BS EN 60749-13:2002

Semiconductor devices. Mechanical and climatic test methods -- Salt atmosphere
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BSI BS EN 60749-13:2002

Semiconductor devices. Mechanical and climatic test methods -- Salt atmosphere

PUBLISH DATE 2002
PAGES 10
BSI BS EN 60749-13:2002
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
SDO BSI: British Standards Institution
Document Number EN 60749-13
Publication Date Sept. 17, 2002
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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