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BSI BS EN 60749-17:2003

Semiconductor devices. Mechanical and climatic test methods -- Neutron irradiation
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BSI BS EN 60749-17:2003

Semiconductor devices. Mechanical and climatic test methods -- Neutron irradiation

PUBLISH DATE 2004
PAGES 10
BSI BS EN 60749-17:2003
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
SDO BSI: British Standards Institution
Document Number EN 60749-17
Publication Date June 29, 2004
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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