BSI BS EN 60749-17:2003

Withdrawn Consolidated
Semiconductor devices. Mechanical and climatic test methods -- Neutron irradiation

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BSI BS EN 60749-17:2003

Semiconductor devices. Mechanical and climatic test methods -- Neutron irradiation

PUBLISH DATE 2004
PAGES 10
BSI BS EN 60749-17:2003

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment.

Applicable to integrated circuits and discrete semiconductor devices.

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