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BSI BS EN 60749-2:2002

Semiconductor devices. Mechanical and climatic test methods -- Low air pressure
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BSI BS EN 60749-2:2002

Semiconductor devices. Mechanical and climatic test methods -- Low air pressure

PUBLISH DATE 2002
PAGES 10
BSI BS EN 60749-2:2002
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.
SDO BSI: British Standards Institution
Document Number EN 60749-2
Publication Date Sept. 24, 2002
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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