+1 888 608-7511
Need help finding a standard?
Help Desk
This Document Has Been Superseded
A newer publication replaces it: BSI BS EN IEC 60749-24
Semiconductor devices. Mechanical and climatic test methods -- Accelerated moisture resistance. Unbiased HAST
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Failed to load document history.
| Publish Date | Document Id | Type | View |
|---|