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BSI BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods -- Latch-up test
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BSI BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods -- Latch-up test

PUBLISH DATE 2011
PAGES 26
BSI BS EN 60749-29:2011

This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.

This test is classified as destructive.

The purpose of this test is to establish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing 'no trouble found' (NTF) and 'electrical overstress' (EOS) failures due to latch-up.

This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established.

The classification of latch-up as a function of temperature is defined in 3.1 and the failure level criteria are defined in 3.2

SDO BSI: British Standards Institution
Document Number EN 60749-29
Publication Date Aug. 31, 2011
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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