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BSI BS EN 60749-3:2017

Semiconductor devices. Mechanical and climatic test methods -- External visual examination
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BSI BS EN 60749-3:2017

Semiconductor devices. Mechanical and climatic test methods -- External visual examination

PUBLISH DATE 2017
PAGES 16
BSI BS EN 60749-3:2017

The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.

SDO BSI: British Standards Institution
Document Number EN 60749-3
Publication Date Nov. 24, 2017
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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