BSI BS EN 60749-3:2017

Current Revision
Semiconductor devices. Mechanical and climatic test methods -- External visual examination

Best Price Guarantee Nov 24, 2017 English 16 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00

You own the digital copy of this edition

View in Library
or
British Standards Institution Logo

BSI BS EN 60749-3:2017

Semiconductor devices. Mechanical and climatic test methods -- External visual examination

PUBLISH DATE 2017
PAGES 16
BSI BS EN 60749-3:2017

The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.

External visual inspection is a non-destructive test and applicable for all package types.

The test is useful for qualification, process monitor, or lot acceptance.

Loading...

Failed to load document history.

Publish Date Document Id Type View