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Semiconductor devices. Mechanical and climatic test methods -- Soft error test method for semiconductor devices with memory
This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.
Two tests are described:
To completely characterize the soft error capability of an integrated circuit with memory, the device must be tested for broad high energy spectrum and thermal neutrons using additional test methods.
This test method may be applied to any type of integrated circuit with memory device.
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