BSI BS EN 60749-39:2006

Withdrawn Revision
Semiconductor devices. Mechanical and climatic test methods -- Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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BSI BS EN 60749-39:2006

Semiconductor devices. Mechanical and climatic test methods -- Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

PUBLISH DATE 2006
PAGES 12
BSI BS EN 60749-39:2006

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components.

These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.

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