BSI BS EN 60749-43:2017

Withdrawn Revision
Semiconductor devices - Mechanical and climatic test methods -- Guidelines for IC reliability qualification plans

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A newer publication replaces it: BSI BS EN IEC 63287-1


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BSI BS EN 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods -- Guidelines for IC reliability qualification plans

PUBLISH DATE 2017
PAGES 42
BSI BS EN 60749-43:2017

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs).

This document is not intended for military- and space-related applications.

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