Semiconductor devices. Mechanical and climatic test methods -- Internal moisture content measurement and the analysis of other residual gases
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.
| SDO | BSI: British Standards Institution |
| Document Number | EN 60749-7 |
| Publication Date | Sept. 30, 2011 |
| Language | en - English |
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| Committee | EPL/47 |
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