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BSI BS EN 60749-7:2011

Semiconductor devices. Mechanical and climatic test methods -- Internal moisture content measurement and the analysis of other residual gases
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BSI BS EN 60749-7:2011

Semiconductor devices. Mechanical and climatic test methods -- Internal moisture content measurement and the analysis of other residual gases

PUBLISH DATE 2011
PAGES 16
BSI BS EN 60749-7:2011

This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.

SDO BSI: British Standards Institution
Document Number EN 60749-7
Publication Date Sept. 30, 2011
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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