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BSI BS EN 60749-8:2003

Semiconductor devices. Mechanical and climatic test methods -- Sealing
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BSI BS EN 60749-8:2003

Semiconductor devices. Mechanical and climatic test methods -- Sealing

PUBLISH DATE 2003
PAGES 20
BSI BS EN 60749-8:2003
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.
SDO BSI: British Standards Institution
Document Number EN 60749-8
Publication Date July 3, 2003
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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