BSI BS EN 60749:1999

Withdrawn Revision
Semiconductor devices. Mechanical and climatic test methods

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Newer publications replace it: BSI BS EN 60335-2-11, BSI BS EN 60749-1, BSI BS EN 60749-20 and 4 more


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BSI BS EN 60749:1999

Semiconductor devices. Mechanical and climatic test methods

PUBLISH DATE 2002
BSI BS EN 60749:1999

Semiconductor devices.

Mechanical and climatic test methods

Uniform preferred test methods and values for stress levels for judging the environmental properties of semiconductor devices (discrete and integrated circuits) from which a selection may be made.

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