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BSI BS EN 60749:1999

Semiconductor devices. Mechanical and climatic test methods
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BSI BS EN 60749:1999

Semiconductor devices. Mechanical and climatic test methods

PUBLISH DATE 2002
BSI BS EN 60749:1999
Semiconductor devices. Mechanical and climatic test methods
Uniform preferred test methods and values for stress levels for judging the environmental properties of semiconductor devices (discrete and integrated circuits) from which a selection may be made.
SDO BSI: British Standards Institution
Document Number EN 60749
Publication Date Sept. 23, 2002
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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