BSI BS EN 62329-1:2006

Current Consolidated
Heat shrinkable moulded shapes -- Definitions and general requirements

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BSI BS EN 62329-1:2006

Heat shrinkable moulded shapes -- Definitions and general requirements

PUBLISH DATE 2007
PAGES 12
BSI BS EN 62329-1:2006

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons.

Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

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