BSI BS EN 62415:2010

Current Revision
Semiconductor devices. Constant current electromigration test

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BSI BS EN 62415:2010

Semiconductor devices. Constant current electromigration test

PUBLISH DATE 2010
PAGES 14
BSI BS EN 62415:2010

This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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