BSI BS IEC 60747-14-11:2021

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Semiconductor devices -- Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

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BSI BS IEC 60747-14-11:2021

Semiconductor devices -- Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

PUBLISH DATE 2021
PAGES 24
BSI BS IEC 60747-14-11:2021

This part of IEC 60747 defines the terms, definitions, configuration, and test methods that can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors.

The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation.

This document excludes devices dealt with by TC 49: piezoelectric, dielectric, and electrostatic devices and associated materials for frequency control, selection, and detection.

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