BSI BS IEC 60748-4-3:2006

Current Revision
Semiconductor devices. Integrated circuits -- Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)

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BSI BS IEC 60748-4-3:2006

Semiconductor devices. Integrated circuits -- Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)

PUBLISH DATE 2007
PAGES 38
BSI BS IEC 60748-4-3:2006

Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.

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