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BSI BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods -- Standard reliability testing methods of non-volatile memory devices
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BSI BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods -- Standard reliability testing methods of non-volatile memory devices

PUBLISH DATE 2020
PAGES 26
BSI BS EN IEC 60749-41:2020

This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

SDO BSI: British Standards Institution
Document Number IEC 60749-41
Publication Date Sept. 9, 2020
Language en - English
Page Count 26
Revision Level
Supercedes
Committee EPL/47
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