BSI BS EN IEC 61189-5-503:2017

Current Revision
Test methods for electrical materials, printed board and other interconnection structures and assemblies -- General test method for materials and assemblies. Conductive anodic filaments (CAF) testing of circuit boards

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BSI BS EN IEC 61189-5-503:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies -- General test method for materials and assemblies. Conductive anodic filaments (CAF) testing of circuit boards

PUBLISH DATE 2018
PAGES 30
BSI BS EN IEC 61189-5-503:2017

This part of IEC 61189 specifies the conductive anodic filament (hereafter referred to as CAF).

It specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

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