BSI BS IEC 62047-32:2019

Current Revision
Semiconductor devices. Micro-electromechanical devices -- Test method for the nonlinear vibration of MEMS resonators

Best Price Guarantee Jan 29, 2019 English 20 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00

You own the digital copy of this edition

View in Library
or
British Standards Institution Logo

BSI BS IEC 62047-32:2019

Semiconductor devices. Micro-electromechanical devices -- Test method for the nonlinear vibration of MEMS resonators

PUBLISH DATE 2019
PAGES 20
BSI BS IEC 62047-32:2019

This part of IEC 62047 specifies the test method and test condition for the nonlinear vibration of MEMS resonators.

The statements made in this document apply to the development and manufacture for MEMS resonators.

Loading...

Failed to load document history.

Publish Date Document Id Type View