BSI BS IEC 62526:2007

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Standard for extensions to standard test interface language (STIL) for semiconductor design environments

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BSI BS IEC 62526:2007

Standard for extensions to standard test interface language (STIL) for semiconductor design environments

PUBLISH DATE 2007
PAGES 124
BSI BS IEC 62526:2007

Provides an interface between digital test generation tools and test equipment.

A test description language is defined that:

  • (a) facilitates the transfer of digital test vector data from CAE to ATE environments;
  • (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and
  • (c) supports the volume of test vector data generated from structured tests.
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