BSI BS IEC 62860-1:2013

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Test methods for the characterization of organic transistor-based ring oscillators

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BSI BS IEC 62860-1:2013

Test methods for the characterization of organic transistor-based ring oscillators

PUBLISH DATE 2014
PAGES 26
BSI BS IEC 62860-1:2013

This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

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