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BSI BS IEC 62951-2:2019

Semiconductor devices. Flexible and stretchable semiconductor devices -- Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
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BSI BS IEC 62951-2:2019

Semiconductor devices. Flexible and stretchable semiconductor devices -- Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

PUBLISH DATE 2019
PAGES 12
BSI BS IEC 62951-2:2019
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin?film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.
SDO BSI: British Standards Institution
Document Number IEC 62951-2
Publication Date April 30, 2019
Language en - English
Page Count 12
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
April 30, 2019 BS IEC 62951-2:2019 Revision