BSI BS IEC 62951-7:2019

Current Revision
Semiconductor devices. Flexible and stretchable semiconductor devices -- Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor

Best Price Guarantee Mar 6, 2019 English 16 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00

You own the digital copy of this edition

View in Library
or
British Standards Institution Logo

BSI BS IEC 62951-7:2019

Semiconductor devices. Flexible and stretchable semiconductor devices -- Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor

PUBLISH DATE 2019
PAGES 16
BSI BS IEC 62951-7:2019

IEC 62951-7:2019 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin-film layer with ultra-low permeation rate under both flat and bending conditions.

This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures.

For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.

Loading...

Failed to load document history.

Publish Date Document Id Type View