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BSI BS EN IEC 62969-4:2018

Semiconductor devices. Semiconductor interface for automotive vehicles -- Evaluation method of data interface for automotive vehicle sensors
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BSI BS EN IEC 62969-4:2018

Semiconductor devices. Semiconductor interface for automotive vehicles -- Evaluation method of data interface for automotive vehicle sensors

PUBLISH DATE 2018
PAGES 24
BSI BS EN IEC 62969-4:2018
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
SDO BSI: British Standards Institution
Document Number IEC 62969-4
Publication Date Aug. 30, 2018
Language en - English
Page Count 24
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Aug. 30, 2018 BS EN IEC 62969-4:2018 Revision