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BSI BS EN IEC 63616:2026

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
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BSI BS EN IEC 63616:2026

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

PUBLISH DATE 2026
PAGES 18
BSI BS EN IEC 63616:2026

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SDO BSI: British Standards Institution
Document Number IEC 63616
Publication Date Jan. 23, 2026
Language en - English
Page Count 18
Revision Level
Supercedes
Committee EPL/46
Publish Date Document Id Type View
Jan. 23, 2026 BS EN IEC 63616:2026 Revision