BSI BS ISO 17915:2018

Current Revision
Optics and photonics. Measurement method of semiconductor lasers for sensing

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BSI BS ISO 17915:2018

Optics and photonics. Measurement method of semiconductor lasers for sensing

PUBLISH DATE 2018
PAGES 38
BSI BS ISO 17915:2018

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as:

  • edge-emitting type
  • vertical cavity surface emitting type lasers
  • bulk-type
  • (strained) quantum well lasers
  • quantum cascade lasers

These lasers are used for optical sensing in e.g. industrial, medical and agricultural fields.

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