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BSI BS ISO 25498:2025

Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
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BSI BS ISO 25498:2025

Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

PUBLISH DATE 2025
PAGES 52
BSI BS ISO 25498:2025

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SDO BSI: British Standards Institution
Document Number ISO 25498
Publication Date May 16, 2025
Language en - English
Page Count 52
Revision Level
Supercedes
Committee CII/9
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