BSI DD ENV 50218:1996

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Description of a parametrized European mini test chip

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BSI DD ENV 50218:1996

Description of a parametrized European mini test chip

PUBLISH DATE 1996
PAGES 26
BSI DD ENV 50218:1996

WITHDRAWN, 4/20/2012

Documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC).

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