BSI DD ENV 50219:1996

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Description of the reliability test structures of the European mini test chip

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BSI DD ENV 50219:1996

Description of the reliability test structures of the European mini test chip

PUBLISH DATE 1996
PAGES 42
BSI DD ENV 50219:1996

WITHDRAWN, 4/20/2012

Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).

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