BSI DD IEC/PAS 61338-1-5:2010

Withdrawn Revision
Waveguide type dielectric resonators -- General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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BSI DD IEC/PAS 61338-1-5:2010

Waveguide type dielectric resonators -- General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

PUBLISH DATE 2010
PAGES 24
BSI DD IEC/PAS 61338-1-5:2010

IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.

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