BSI DD IEC/PAS 62483:2006

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Test method for measuring whisker growth on tin and tin alloy surface finishes

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BSI DD IEC/PAS 62483:2006

Test method for measuring whisker growth on tin and tin alloy surface finishes

PUBLISH DATE 2007
PAGES 30
BSI DD IEC/PAS 62483:2006

Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn).

This test method may not be sufficient for applications with special requirements, e.g., military or aerospace.

Additional requirements may be specified in the appropriate requirements document.

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