BSI DD IEC/TS 62396-2:2008

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Process management for avionics. Atmospheric radiation effects -- Guidelines for single event effects testing for avionics systems

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BSI DD IEC/TS 62396-2:2008

Name: BSI DD IEC/TS 62396-2:2008 – Process management for avionics. Atmospheric radiation effects -- Guidelines for single event effects testing for avionics systems
Brand: British Standards Institution
SKU: BSI DD IEC/TS 62396-2:2008
Price: 310.76 USD
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Process management for avionics. Atmospheric radiation effects -- Guidelines for single event effects testing for avionics systems

PUBLISH DATE 2008

PAGES 28

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons.

Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons in the atmosphere at aircraft altitudes.