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BSI DD IEC/TS 62396-2:2008

Process management for avionics. Atmospheric radiation effects -- Guidelines for single event effects testing for avionics systems
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BSI DD IEC/TS 62396-2:2008

Process management for avionics. Atmospheric radiation effects -- Guidelines for single event effects testing for avionics systems

PUBLISH DATE 2008
PAGES 28
BSI DD IEC/TS 62396-2:2008
IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
SDO BSI: British Standards Institution
Document Number IEC/TS 62396-2
Publication Date Oct. 31, 2008
Language en - English
Page Count 28
Revision Level
Supercedes
Committee GEL/107
Publish Date Document Id Type View
Oct. 31, 2008 DD IEC/TS 62396-2:2008 Revision