BSI DD ISO/TS 10798:2011

Current Revision
Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

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BSI DD ISO/TS 10798:2011

Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

PUBLISH DATE 2011
PAGES 38
BSI DD ISO/TS 10798:2011

This Technical Specification establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

The methods described here for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).

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