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BSI PD CEN/TR 10353:2011

Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry
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BSI PD CEN/TR 10353:2011

Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry

PUBLISH DATE 2011
PAGES 34
BSI PD CEN/TR 10353:2011

This Technical Report describes an inductively coupled plasma optical emission spectrometric method for the determination of Al, Ti and P contents in ferro-silicon materials.

The method is applicable to:

  • Al contents between 0,2 and 2 %;

  • Ti contents between 0,02 and 0,25 %;

  • P contents between 0,005 and 0,05 %.

The procedure is valid for the analytical lines given in Table 1. This table also gives, for each line, the spectral interferences, which shall be corrected.

NOTE The interferences extent as well as other possible interferences depend on the temperature in the plasma and on the optical resolution of the spectrometer used.

Table 1 — Spectral lines recommended together with the interferences which shall be corrected

Element Wavelength (nm) Interferences
Al 308,22 V
Ti 337,28 V, Ni
P 178,29 Mo
SDO BSI: British Standards Institution
Document Number CEN/TR 10353
Publication Date Nov. 30, 2011
Language en - English
Page Count
Revision Level
Supercedes
Committee ISE/1
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