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Chemical analysis of ferrous Materials. Analysis of ferro-silicon. Determination of Si and Al by X-ray fluorescence spectrometry
This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials.
The method is applicable to:
Si contents between 40 % and 90 %;
Al contents between 0,5 % and 6 %.
The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines:
Si KΞ± 7.126 (for element contents between 45 % and 90 %);
Al KΞ± 8.339 (for element contents between 0,8 % and 6 %);
Fe KΞ± 1.937 (for element contents between 10 % and 58 %).
NOTE For matrix matching purposes, iron is included in the analytical program to be prepared.
Within the conditions here above, spectral interferences donβt need to be calculated.
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