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BSI PD CEN/TR 10354:2011

Chemical analysis of ferrous Materials. Analysis of ferro-silicon. Determination of Si and Al by X-ray fluorescence spectrometry
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BSI PD CEN/TR 10354:2011

Chemical analysis of ferrous Materials. Analysis of ferro-silicon. Determination of Si and Al by X-ray fluorescence spectrometry

PUBLISH DATE 2012
PAGES 24
BSI PD CEN/TR 10354:2011

This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials.

The method is applicable to:

  • Si contents between 40 % and 90 %;

  • Al contents between 0,5 % and 6 %.

The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines:

  • Si Kα 7.126 (for element contents between 45 % and 90 %);

  • Al Kα 8.339 (for element contents between 0,8 % and 6 %);

  • Fe Kα 1.937 (for element contents between 10 % and 58 %).

NOTE For matrix matching purposes, iron is included in the analytical program to be prepared.

Within the conditions here above, spectral interferences don’t need to be calculated.

SDO BSI: British Standards Institution
Document Number CEN/TR 10354
Publication Date March 31, 2012
Language en - English
Page Count
Revision Level
Supercedes
Committee ISE/1
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