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Non-destructive testing. Test method for determining residual stresses by synchrotron x-ray diffraction
This document describes the test method for determining residual stresses in polycrystalline materials by the synchrotron X-ray diffraction method. The method can be applied to both homogeneous and inhomogeneous materials including those containing distinct phases.
Information on how to carry out residual stress measurements by the synchrotron X-ray diffraction technique is provided as:
Procedures are presented for calibrating synchrotron X-ray diffraction instruments, enabling:
and also for:
The principles of the synchrotron X-ray diffraction technique are described and put into perspective with EN 15305:2008 and EN ISO 21432:2020, which are used to measure stresses in the bulk of a specimen.
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