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BSI PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions -- General conditions and definitions. Near-field scan data exchange format
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BSI PD IEC/TR 61967-1-1:2015

Integrated circuits. Measurement of electromagnetic emissions -- General conditions and definitions. Near-field scan data exchange format

PUBLISH DATE 2015
PAGES 68
BSI PD IEC/TR 61967-1-1:2015

This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.

The scope of this technical report excludes:

  • the methods used for the measurements or simulations,
  • the software and algorithms used for generating the exchange file,
  • the processing or viewing of the data contained therein.
SDO BSI: British Standards Institution
Document Number IEC/TR 61967-1-1
Publication Date Sept. 30, 2015
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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