Process management for avionics. Atmospheric radiation effects -- Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines
This part of IEC 62396 is intended to provide awareness and guidance with regard to the effects of small particles (that is, protons, electrons, pions and muon fluxes) and single event effects on avionics electronics used in aircraft operating at altitudes up to 60 000 feet (18 300 m). This is an emerging topic and lacks substantive supporting data. This document is intended to help aerospace or ground level electronic equipment manufacturers and designers by providing awareness guidance for this new emerging topic.
Details of the radiation environment are provided together with identification of potential problems caused as a result of the atmospheric radiation received. Appropriate methods are given for quantifying single event effect (SEE) rates in electronic components.
NOTE 1 The overall system safety methodology is usually expanded to accommodate the single event effects rates and to demonstrate the suitability of the electronics for application at the electronic component, electronic equipment and system level.
NOTE 2 For the purposes of this document the terms 'electronic device' and 'electronic component' are used interchangeably.
Although developed for the avionics industry, this document can be used by other industrial sectors at their discretion.
| SDO | BSI: British Standards Institution |
| Document Number | IEC TR 62396-8 |
| Publication Date | May 12, 2020 |
| Language | en - English |
| Page Count | 62 |
| Revision Level | |
| Supercedes | |
| Committee | GEL/107 |