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BSI PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices
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BSI PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

PUBLISH DATE 2018
PAGES 20
BSI PD IEC/TR 63133:2017

This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.

The estimated ageing level can be used to improve the reliability of system.

SDO BSI: British Standards Institution
Document Number IEC/TR 63133
Publication Date Jan. 29, 2018
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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