BSI PD IEC/TR 63133:2017

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Semiconductor devices. Scan based ageing level estimation for semiconductor devices

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BSI PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

PUBLISH DATE 2018
PAGES 20
BSI PD IEC/TR 63133:2017

This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.

The estimated ageing level can be used to improve the reliability of system.

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