Logo
Login Sign Up
Current Revision

BSI PD IEC/TS 62607-5-1:2014

Nanomanufacturing. Key control characteristics -- Thin-film organic/nano electronic devices. Carrier transport measurements
Best Price Guarantee
Instant

$222.36

2-5 Days

$222.36

SAVE 10%

$400.25


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
British Standards Institution Logo

BSI PD IEC/TS 62607-5-1:2014

Nanomanufacturing. Key control characteristics -- Thin-film organic/nano electronic devices. Carrier transport measurements

PUBLISH DATE 2014
PAGES 20
BSI PD IEC/TS 62607-5-1:2014

This part of IEC 62607, which is a Technical Specification, provides a standardized sample structure for characterizing charge transport properties in thin-film organic/nano electronic devices and a format to report details of the structure which shall be provided with the measurement results.

The standardized OTFT testing structure with a contact-area-limited doping can mitigate contact resistance and enable reliable measurement of the charge carrier mobility.

The purpose of this Technical Specification is to provide test sample structures for determining the intrinsic charge transport properties of organic thin-film devices.

The intention is to provide reliable materials information for OTFTs and to set guidelines for making test sample structures so that materials information is clear and consistent throughout the research community and industry.

SDO BSI: British Standards Institution
Document Number IEC/TS 62607-5-1
Publication Date Dec. 31, 2014
Language en - English
Page Count
Revision Level
Supercedes
Committee NTI/1
Loading...

Failed to load document history.

Publish Date Document Id Type View