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BSI PD IEC/TS 62607-6-4:2016

Nanomanufacturing. Key control characteristics -- Graphene. Surface conductance measurement using resonant cavity
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BSI PD IEC/TS 62607-6-4:2016

Nanomanufacturing. Key control characteristics -- Graphene. Surface conductance measurement using resonant cavity

PUBLISH DATE 2016
PAGES 22
BSI PD IEC/TS 62607-6-4:2016

This part of IEC 62607 establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite [3].

The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].

Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area.

This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.

SDO BSI: British Standards Institution
Document Number IEC/TS 62607-6-4
Publication Date Oct. 31, 2016
Language en - English
Page Count
Revision Level
Supercedes
Committee NTI/1
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