BSI PD ISO/TR 21477:2017

Current Revision
Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems

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BSI PD ISO/TR 21477:2017

Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems

PUBLISH DATE 2017
PAGES 12
BSI PD ISO/TR 21477:2017

This document intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISOΒ 10110‑7 and ISOΒ 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them.

Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.

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