BSI PD ISO/TS 16965:2013

Withdrawn Revision

Soil quality. Determination of trace elements using inductively coupled plasma mass spectrometry (ICP-MS)

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A newer publication replaces it: BSI BS EN ISO 16965

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BSI PD ISO/TS 16965:2013

Name: BSI PD ISO/TS 16965:2013 – Soil quality. Determination of trace elements using inductively coupled plasma mass spectrometry (ICP-MS)
Brand: British Standards Institution
SKU: BSI PD ISO/TS 16965:2013
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Soil quality. Determination of trace elements using inductively coupled plasma mass spectrometry (ICP-MS)

PUBLISH DATE 2013

PAGES 22

This Technical Specification specifies a method for the determination of the following elements in aqua regia or nitric acid digests or other extraction solutions of sludge, treated biowaste and soil:

Aluminium (Al), antimony (Sb), arsenic (As), barium (Ba), beryllium (Be), bismuth (Bi), boron (B), cadmium (Cd), calcium (Ca), cerium (Ce), cesium (Cs), chromium (Cr), cobalt (Co), copper (Cu), dysprosium (Dy), erbium (Er), europium (Eu), gadolinium (Gd), gallium (Ga), germanium (Ge), gold (Au), hafnium (Hf), holmium (Ho), indium (In), iridium (Ir), iron (Fe), lanthanum (La), lead (Pb), lithium (Li), lutetium (Lu), magnesium (Mg), manganese (Mn), mercury (Hg), molybdenum (Mo), neodymium (Nd), nickel (Ni), palladium (Pd), phosphorus (P), platinum (Pt), potassium (K), praseodymium (Pr), rhenium (Re), rhodium (Rh), rubidium (Rb), ruthenium (Ru), samarium (Sm), scandium (Sc), selenium (Se), silicon (Si), silver (Ag), sodium (Na), strontium (Sr), sulfur (S), tellurium (Te), terbium (Tb), thallium (Tl), thorium (Th), thulium (Tm), tin (Sn), titanium (Ti), tungsten (W), uranium (U), vanadium (V), ytterbium (Yb), yttrium (Y), zinc (Zn) and zirconium (Zr).

The working range depends on the matrix and the interferences encountered.

The limit of detection is between 0,1 mg/kg dry matter and 2,0 mg/kg dry matter for most elements.

The limit of detection will be higher in cases where the determination is likely to have interferences (see Clause 4) or in the case of memory effects (see e.g. 8.2 of ISO 17294-1:2004).