CIE x040:2014

Current Revision
Proceedings of CIE Expert Symposium on Measurement Uncertainties in Photometry and Radiometry for Industry, 2014

Best Price Guarantee Jan 1, 2014 English 80 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00

You own the digital copy of this edition

View in Library
or
CIE x040:2014 PDF Preview
CIE x040:2014
This Symposium was organized by CIE Division 2 in cooperation with the CIE Central Bureau, and was hosted by the CIE Central Bureau in Vienna, Austria. The Symposium featured contributed papers of leading experts in photometry and radiometry presenting facts and recent research in measurement uncertainties in photometry and radiometry, especially regarding application in industry.
Loading...

Failed to load document history.

Publish Date Document Id Type View